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991.
José Martínez-Aroza Ramón Román-Roldán 《Multidimensional Systems and Signal Processing》1995,6(1):7-35
A multiresolution analysis of digital gray-level images is presented. A gray-level multi-scale framework is determined from two main assumptions: the gray scale is binary at the finest spatial resolution, and the gray levels of composed regions are obtained additively. In order to interrelate the gray-level histograms of the same image at different resolutions, probabilistic linear models are developed, which are then applied for estimation. Linear-optimization theory is used as a way of constructing such models. A general procedure for image processing is sketched, based on gray-level estimation. A versatile algorithm for nonlinear filtering is derived. Some examples of prospective applications are given.This work was partially supported by grant TIC91-646 from the DGYCIT of the Spanish Government. 相似文献
992.
The growth of nominally undoped GaSb layers by atmospheric pressure metalorganic vapor phase epitaxy on GaSb and GaAs substrates
is studied. Trimethylgallium and trimethylantimony are used as precursors for the growth at 600°C in a horizontal reactor.
The effect of carrier gas flow, V/III-ratio, and trimethylgallium partial pressure on surface morphology, electrical properties
and photoluminescence is investigated. The optimum values for the growth parameters are established. The carrier gas flow
is shown to have a significant effect on the surface morphology. The optimum growth rate is found to be 3–8 μm/ h, which is
higher than previously reported. The 2.5 μm thick GaSb layers on GaAs are p-type, having at optimized growth conditions room-temperature
hole mobility and hole concentration of 800 cm2 V−1 s−1 and 3·1016 cm-3, respectively. The homoepitaxial GaSb layer grown with the same parameters has mirror-like surface and the photoluminescence
spectrum is dominated by strong excitonic lines. 相似文献
993.
用于X光激光实验的反射式线聚焦光学系统的设计和分析 总被引:1,自引:1,他引:0
基于三维光线追迹的象差计算,对卢瑟福实验室用离轴球面反射线聚焦系统作了分析。然后,首次提出了用于X光激光实验的两类新的反射式线聚焦构型,即反射式光楔列阵和光锥列阵系统,并作了计算。最后,对所得结果作了比较和讨论。 相似文献
994.
Epitaxial CdTe layers were grown using organometallic vapor phase epitaxy on Si substrates with a Ge buffer layer. Ge layer
was grown in the same reactor using germane gas and the reaction of germane gas with the native Si surface is studied in detail
at low temperature. It is shown that germane gas can be used to “clean” the Si surface oxide prior to CdTe growth by first
reducing the thin native oxide that may be present on Si. When Ge layer was grown on Si using germane gas, an induction period
was observed before the continuous layer of Ge growth starts. This induction period is a function of the thickness of the
native oxide present on Si and possible reasons for this behavior are outlined. Secondary ion mass spectrometry (SIMS) data
show negligible outdiffusion and cross contamination of Ge in CdTe. 相似文献
995.
996.
J. Shin Y. Hsu T. C. Hsu G. B. Stringfellow R. W. Gedridge 《Journal of Electronic Materials》1995,24(11):1563-1569
GalnSb alloys as well as the constituent binaries InSb and GaSb have been grown by organometallic vapor phase epitaxy using
the new antimony precursor trisdimethylaminoantimony (TDMASb) combined with conventional group III precursors trimethylindium
(TMIn) and trimethylgallium (TMGa). InSb layers were grown at temperatures between 275 and 425°C. The low values of V/III
ratio required to obtain good morphologies at the lowest temperatures indicate that the pyrolysis temperature is low for TDMASb.
In fact, at the lowest temperatures, the InSb growth efficiency is higher than for other antimony precursors, indicating the
TDMASb pyrolysis products assist with TMIn pyrolysis. A similar, but less pronounced trend is observed for GaSb growth at
temperatures of less than 500°C. No excess carbon contamination is observed for either the InSb or GaSb layers. Ga1-xInxSb layers with excellent morphologies with values of x between 0 and 0.5 were grown on GaSb substrates without the use of
graded layers. The growth temperature was 525°C and the values of V/III ratio, optimized for each value of x, ranged between
1.25 and 1.38. Strong photoluminescence (PL) was observed for values of x of less than 0.3, with values of halfwidth ranging
from 13 to 16 meV, somewhat smaller than previous reports for layers grown using conventional precursors without the use of
graded layers at the interface. The PL intensity was observed to decrease significantly for higher values of x. The PL peak
energies were found to track the band gap energy; thus, the luminescence is due to band edge processes. The layers were all
p-type with carrier concentrations of approximately 1017 cm3. Transmission electron diffraction studies indicate that the Ga0.5In0.5 Sb layers are ordered. Two variants of the Cu-Pt structure are observed with nearly the same diffracted intensities. This
is the first report of ordering in GalnSb alloys. 相似文献
997.
GaP:(N)的背景光谱和发光尖峰 总被引:1,自引:0,他引:1
获得高分辨GaP(N)光致发光光谱,观察到等电子陷陆束缚激子发光中LO和loc多声子发射,其强度分布答合泊松分布。将声子伴带区分为直接光跃迁和间接光跃迁,并进行了相应讨论,还观察到局域声子效应--光谱相似定律和相当显著的背景光谱。 相似文献
998.
在宝钢3号高炉计算机系统的开发过程中十分注意系统RAS性能设计。本文介绍了3号高炉计算机系统设计中,为提高系统的RAS性能所采取的各种对策。 相似文献
999.
1000.